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        <identifier>oai:materialscloud.org:2286</identifier>
        <datestamp>2024-08-07T14:28:01Z</datestamp>
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          <dc:contributor>Kępa, Marcin</dc:contributor>
          <dc:contributor>Focke, Niels</dc:contributor>
          <dc:contributor>Cywiński, Łukasz</dc:contributor>
          <dc:contributor>Krzywda, Jan A.</dc:contributor>
          <dc:creator>Kępa, Marcin</dc:creator>
          <dc:creator>Focke, Niels</dc:creator>
          <dc:creator>Cywiński, Łukasz</dc:creator>
          <dc:creator>Krzywda, Jan A.</dc:creator>
          <dc:date>2024-08-07</dc:date>
          <dc:description>Due to presence of magnetic field gradient needed for coherent spin control, dephasing of single-electron spin qubits in silicon quantum dots is often dominated by 1/f charge noise. We investigate theoretically fluctuations of ground state energy of an electron in gated quantum dot in realistic Si/SiGe structure. We assume that the charge noise is caused by motion of charges trapped at the semiconductor-oxide interface. We consider a realistic range of trapped charge densities, ρ∼10¹⁰ cm⁻², and typical lenghtscales of isotropically distributed displacements of these charges, δr≤1 nm, and identify pairs (ρ,δr) for which the amplitude and shape of the noise spectrum is in good agreement with spectra reconstructed in recent experiments on similar structures.</dc:description>
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          <dc:identifier>https://doi.org/10.24435/materialscloud:mx-0w</dc:identifier>
          <dc:identifier>oai:materialscloud.org:2286</dc:identifier>
          <dc:identifier>mcid:2024.118</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:publisher>Materials Cloud</dc:publisher>
          <dc:relation>https://doi.org/10.48550/arXiv.2303.13968</dc:relation>
          <dc:relation>https://doi.org/10.1063/5.0151029</dc:relation>
          <dc:relation>https://pubs.aip.org/aip/apl/article-abstract/123/3/034005/2903215/Simulation-of-1-f-charge-noise-affecting-a-quantum?redirectedFrom=fulltext</dc:relation>
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          <dc:relation>https://doi.org/10.24435/materialscloud:x3-6f</dc:relation>
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          <dc:rights>Creative Commons Attribution 4.0 International</dc:rights>
          <dc:rights>https://creativecommons.org/licenses/by/4.0/legalcode</dc:rights>
          <dc:subject>Quantum dots</dc:subject>
          <dc:subject>Simulation</dc:subject>
          <dc:subject>Charge noise</dc:subject>
          <dc:title>Simulation of 1/f charge noise affecting a quantum dot in a Si/SiGe structure</dc:title>
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