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        <identifier>oai:materialscloud.org:2627</identifier>
        <datestamp>2026-01-26T12:56:10Z</datestamp>
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          <dc:contributor>Turlo, Vladyslav</dc:contributor>
          <dc:creator>Hu, Yang</dc:creator>
          <dc:creator>Sharma, Amit</dc:creator>
          <dc:creator>Druzhinin, Aleksandr</dc:creator>
          <dc:creator>Cancellieri, Claudia</dc:creator>
          <dc:creator>Turlo, Vladyslav</dc:creator>
          <dc:date>2025-04-07</dc:date>
          <dc:description>This study introduces new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/W NMLs, these models show that ignoring such features can inflate measured interface stress by up to 0.4 J/m^2. However, corrugation and roughness alone cannot account for the extreme stresses reported, suggesting that atomic-scale phenomena (e.g., intermixing and metastable phase formation at the interfaces) dominate. These findings highlight the importance of balancing bilayer counts and thickness-to-roughness ratios for reliable stress quantification, providing a practical pathway to designing and characterizing advanced nanocomposite coatings with improved accuracy.</dc:description>
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          <dc:identifier>https://doi.org/10.24435/materialscloud:d2-jw</dc:identifier>
          <dc:identifier>oai:materialscloud.org:2627</dc:identifier>
          <dc:identifier>mcid:2025.53</dc:identifier>
          <dc:language>eng</dc:language>
          <dc:publisher>Materials Cloud</dc:publisher>
          <dc:relation>https://doi.org/10.48550/arXiv.2501.18247</dc:relation>
          <dc:relation>https://doi.org/10.1016/j.apsusc.2025.163190</dc:relation>
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          <dc:rights>Creative Commons Attribution 4.0 International</dc:rights>
          <dc:rights>https://creativecommons.org/licenses/by/4.0/legalcode</dc:rights>
          <dc:subject>interface stress</dc:subject>
          <dc:subject>nanomultilayers</dc:subject>
          <dc:subject>corrugations</dc:subject>
          <dc:subject>roughness</dc:subject>
          <dc:subject>model</dc:subject>
          <dc:subject>MARVEL/P1</dc:subject>
          <dc:title>Refining interface stress measurement in nanomultilayers through layer corrugation and interface roughness corrections</dc:title>
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