Publication date: Apr 07, 2025
This study introduces new models that incorporate layer corrugation and interface roughness into standard approaches for measuring interface stress in nanomultilayers (NMLs). Applied to Cu/W NMLs, these models show that ignoring such features can inflate measured interface stress by up to 0.4 J/m^2. However, corrugation and roughness alone cannot account for the extreme stresses reported, suggesting that atomic-scale phenomena (e.g., intermixing and metastable phase formation at the interfaces) dominate. These findings highlight the importance of balancing bilayer counts and thickness-to-roughness ratios for reliable stress quantification, providing a practical pathway to designing and characterizing advanced nanocomposite coatings with improved accuracy.
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Hu_Data.zip
MD5md5:b52c5cb600f7fe45b05652af03bc744c
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538.7 KiB | Calculations of Young's modulus and biaxial modulus of Cu/W bilayers with varying layer thickness. Readme file is provided inside. |
2025.53 (version v1) [This version] | Apr 07, 2025 | DOI10.24435/materialscloud:d2-jw |